Structural, compositional and elemental analysis of materials
Structural, compositional and elemental analyses are important tools for understanding material properties, product development, failure analysis and quality control.
Towards better quality and more sustainable products
With nanometre precision
We have a versatile and high-quality fleet of equipment at our disposal. For structural, compositional and elemental analyses, our main test methods are
- microscopy
- Scanning electron microscopy (SEM)
- energy dispersive spectrometry analyses (EDS)
- microtomography (MicroCT) equipped with thermal and load elements
- analysis of the chemical composition of materials (FTIR)
- X-ray fluorescence analyses (XRF).
Images of different materials taken with a Hitachi S-4800 SEM scanning electron microscope. The arrangement of atoms is a wonderful thing. Clicking on an image will open it in a new tab.
The most common analytical instruments at Mikpolis, which are mainly suitable for the analysis of solid materials:
- Leica MZ 16 stereomicroscope with Leica DFC280 microscope camera
- Hitachi S-4800 SEM –Scanning electron microscope
- XFlash 7 –EDS-detector connected to a Hitachi S-4800 SEM scanning electron microscope
- Neoscan CTS N80 –microtomography equipment
- Nicolet 4700 -Fourier-transformation infrared spectrometer (FTIR)
- Innov-X Handheld XRF -analyser.
The most common standards we use for elemental analyses:
- ASTM E 1508
- ASTM E 1621
Our skilled experts
